Multimode Atomic Force Microscopy

  • Operating mode: Touch mode, Tap mode
  • XY scan range: 20*20um, optional 50*50um, 100*100um
  • Z scan range: 2.5um, optional 5um, 10um
  • Scan resolution: Horizontal 0.2nm, Vertical 0.05nm
  • Specification

    1.The laser detection head and the sample scanning stage are integrated, the structure is very stable, and the anti-interference is strong

    2.Precision probe positioning device, laser spot alignment adjustment is very easy

    3.Single-axis drive sample automatically approaches the probe vertically, so that the needle tip is perpendicular to the sample scan

    4.The intelligent needle feeding method of motor-controlled pressurized piezoelectric ceramic automatic detection protects the probe and the sample

    5.Automatic optical positioning, no need to focus, real-time observation and positioning of the probe sample scanning area

    6.Spring suspension shockproof method, simple and practical, good shockproof effect

    7.Metal shielded soundproof box, built-in high-precision temperature and humidity sensor, real-time monitoring of the working environment

    8.Integrated scanner nonlinear correction user editor, nanometer characterization and measurement accuracy better than 98%

    Operating mode touch mode, tap mode
    Optional mode Friction/Lateral Force, Amplitude/Phase, Magnetic/Electrostatic Force
    force spectrum curve F-Z force curve, RMS-Z curve
    XY scan range 20*20um, optional 50*50um, 100*100um
    Z scan range 2.5um, optional 5um, 10um
    Scan resolution Horizontal 0.2nm, Vertical 0.05nm
    Sample size Φ≤90mm, H≤20mm
    Sample stage travel 15*15mm
    Optical observation 4X optical objective lens/2.5um resolution
    Scan speed 0.6Hz-30Hz
    Scan angle 0-360°
    Operating environment Windows XP/7/8/10 operating system
    Communication Interface USB2.0/3.0
    Shock-absorbing design Spring Suspended/Metal Shielded Box


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